Patent · US Active

Inspection systems and methods of operation

US7389206B2 · kind B2 · utility

3Cited by
40References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 10, 2006
Grant dateJun 17, 2008
Priority date
Expiry dateAug 10, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/9046
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for inspecting an object is provided. The method includes applying a pulsed excitation signal to the object and detecting a transient response signal to the pulsed excitation signal. The method also includes convolving the transient response signal with a plurality of orthogonal functions to generate a plurality of orthogonal components.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.