Inspection substrate for display device
US7391053B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 5, 2005 |
| Grant date | Jun 24, 2008 |
| Priority date | — |
| Expiry date | Jun 29, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/00
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
In order to make it possible to easily detect an electrical defect by using an array tester, the present inspection substrate includes: plural scan lines and plural signal lines; plural storage capacitor lines arranged in parallel to the scan lines; storage capacitor elements, each of which uses a part of the storage capacitor line as one of electrodes thereof; storage capacitor upper electrodes formed of the same layer as that for the signal lines and electrically connected to the storage capacitor elements; switching elements arranged on intersection points of the signal lines and the scan lines and electrically connected to the storage capacitor elements; and dummy wiring lines formed by use of at least one of two types of metals constituting electrodes of the switching elements, and electrically connected to any of the scan lines, the signal lines, the storage capacitor lines and the storage capacitor upper electrodes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.