Integrated optoelectronic system for measuring fluorescence or luminescence emission decay
US7391512B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2004 |
| Grant date | Jun 24, 2008 |
| Priority date | — |
| Expiry date | Oct 4, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6408
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode detecting the emission; (d) a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.