Device and method for the determination of the quality of surfaces
US7391518B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2000 |
| Grant date | Jun 24, 2008 |
| Priority date | — |
| Expiry date | Sep 22, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/1282
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means and an output (display) means. Said first optical means comprises an illuminating means having at least one LED as its light source and serves the function of illuminating the measurement surface at a predetermined angle. Said second optical means is likewise directed at a predetermined angle to the measurement surface and receives the reflected light. A photo sensor of said second optical means emits an electrical measurement signal which is characteristic of said reflected light.The light emitted from the illuminating means is configured such that its spectral characteristic comprises blue, green and red spectral components in the visible light spectrum. A filter means is arranged in the path of radiation between the light source and the photo sensor and which changes the spectral characteristics of the incident light so as to approach a predetermined spectral distribution. The control and evaluation means control the me…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.