Patent · US Expired

System and method for three dimensional change detection and measurement of a scene using change analysis

US7391899B2 · kind B2 · utility

14Cited by
7References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 2005
Grant dateJun 24, 2008
Priority date
Expiry dateMay 1, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/39
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method (100) comprises steps of: receiving a first digital model (102) of a first three-dimensional scene comprising at least one object; receiving a second digital model (112) of a second three-dimensional scene comprising at least one object; and performing a change analysis (102) on the first and second digital models to provide a difference indication representing a difference between the first and second models. In one embodiment a mean square error operation (110) is performed on the first and second digital models to provide a value indicating the difference between the digital models. In another embodiment, a conflation operation is performed on the difference model provided by the change analysis (120) and an object level change database (124) is produced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.