Probe pin cleaning system
US7392563B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2004 |
| Grant date | Jul 1, 2008 |
| Priority date | — |
| Expiry date | Jul 30, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R3/00
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
An improved device for cleaning probe pins of a probe head assembly is presented. The device includes a first holding plate, a second holding plate and a cleaning cartridge. The first holding plate secures the probe head assembly. The second holding plate secures the cleaning cartridge in proximity to the first holding plate. The cleaning cartridge has a chamber. The chamber includes a cleaning solution and an absorbent pad located therein. The absorbent pad is saturated with the cleaning solution and prevents leakage of the cleaning solution out of the chamber. During cleaning operations, the first holding plate is positioned about the second holding plate such that the probe pins of a probe head extend into and contact the absorbent pad in the chamber. Once contact is established, the cleaning solution acts upon the probe pin tips to remove unwanted debris. A depth of penetration of the pins into the pad is controlled by a surface of the cartridge.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.