Method and system to calibrate an oscillator within an RFID circuit utilizing a test signal supplied to the RFID circuit
US7394324B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 13, 2004 |
| Grant date | Jul 1, 2008 |
| Priority date | — |
| Expiry date | Jan 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In accordance with one aspect of the present invention, there is provided a method of calibrating an oscillator within a radio-frequency identification (RFID) circuit for use in an RFID tag. The oscillator has an oscillation frequency. A calibration value is stored within a non-volatile memory associated with the RFID circuit. The oscillator is calibrated in accordance with the calibration value. The storing of the calibration value includes recovering a reference frequency from a test signal supplied to the RFID circuit, calculating the calibration value to correspond to a difference between the recovered reference frequency and the oscillator frequency, and writing the calibration value to the non-volatile memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.