Methods and apparatuses for applying different color calibrations at different locations in an imaging photometer measurement
US7394540B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2005 |
| Grant date | Jul 1, 2008 |
| Priority date | — |
| Expiry date | May 20, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/465
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for applying different color calibrations at different locations in an imaging photometer measurement are disclosed herein. In one embodiment, a method for measuring a light source having a first area with a first spectral distribution and a second area having a second spectral power distribution can include selecting one or more data points in the first area for measurement. The method then includes applying a calibration to the selected data points in the first area such that a desired colorimetric result is displayed for each data point in a single colorimetric measurement of the first area. In several embodiments, the method can further include selecting one or more data points in the second area, and applying a different calibration to the selected portions of the second area such that a desired colorimetric result is also displayed for each data point in the second area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.