Patent · US Active

Method and apparatus for full phase interferometry

US7394546B2 · kind B2 · utility

5Cited by
11References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 22, 2006
Grant dateJul 1, 2008
Priority date
Expiry dateAug 31, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/45
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the dither frequencies, generating more than one real-valued interferograms from demodulated signals, and using the real-valued interferograms to obtain the complex spectral interferogram.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.