Patent · US Expired

Integrated measurement device

US7394553B2 · kind B2 · utility

12Cited by
21References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2005
Grant dateJul 1, 2008
Priority date
Expiry dateAug 21, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/27
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated measurement device for taking gauge and cross-level measurements between two objects. The integrated measurement device includes at least an emitter/receiver unit, a sensor unit, and a microprocessor. In operation, the integrated measurement device is pivotably placed on the top of the first object such that a light emitted from the emitter/receiver unit travels along a surface of the second object as the device rotates about a pivot point of the first object. The sensor unit senses data associated with incident angles and traveling distances of the emitted light. Based on the data sensed by the sensor unit, the microprocessor calculates the incident angle, the traveling distance, and a distance between the first and second objects. The calculated values can also be transformed to (x, y) space coordinates that are used to describe a profile of the second object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.