Patent · US Active

Measuring system and method for the functional monitoring thereof

US7395178B2 · kind B2 · utility

2Cited by

5References

6Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Hermann Hofbauer · Trostberg, DE
Erich Strasser · Trostberg, DE

Key dates

Filing date	Jul 5, 2007
Grant date	Jul 1, 2008
Priority date	—
Expiry date	Jul 5, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01D18/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring system includes a measuring device, another device and a device configured to transmit data enabling bits of data to be transmitted between the measuring device and the other device. The measuring device also includes a signal monitoring circuit and a switch element. The switch element is electrically contacted to a test potential source. The test potential source is in contact with the signal monitoring circuit according to a switch element state. The signal monitoring circuit is also in contact with the device for transmitting date. A method provides for functional monitoring of such a measuring system in a monitoring mode when a test potential is applied.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.