Patent · US Expired

Test-cases for functional verification of system-level interconnect

US7395196B2 · kind B2 · utility

1Cited by
0References
32Claims
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Key dates

Filing dateAug 30, 2004
Grant dateJul 1, 2008
Priority date
Expiry dateMar 13, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3323
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Generation of test cases for functional verification of a complex system-under-test is achieved by the use of a probability matrix. The probability matrix represents a non-uniform distribution function of resource combinations used in the transactions, and can be created randomly, or by application of various types of testing knowledge. The matrix is used by a test generator for selecting resources that participate in a transaction involving an interconnect between different types of system components. Applying the inventive principles increases the quality of design verification by stimulation of both the system's resources and its internal interconnects, with almost no knowledge of the structure of the system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.