Defect estimation apparatus and related method
US7395462B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 25, 2005 |
| Grant date | Jul 1, 2008 |
| Priority date | — |
| Expiry date | Feb 21, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2541
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.