Patent · US Expired

Rules and directives for validating correct data used in the design of semiconductor products

US7398492B2 · kind B2 · utility

6Cited by
37References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 20, 2004
Grant dateJul 8, 2008
Priority date
Expiry dateMar 16, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method to validate data used in a design of a semiconductor product. The method includes (a) reading resources of an application set defining the semiconductor product in a partially fabricated state comprising fabrication layers up to and including a lowest conductive layer (b) reading a user specification that (i) is developed based upon the application set at the partially fabricated state and (ii) establishes at least one upper conductive layer added to the application set that completes the design of the semiconductor product, (c) allocating a new resource from the user specification to the design of the semiconductor product, said new resource having multiple parameters, (d) validating the allocation of the new resource against the resources of the application set and (e) propagating the allocation of the new resource and the parameters throughout a description of the semiconductor product.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.