Method and apparatus for enhanced ion mobility based sample analysis using various analyzer configurations
US7399958B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2006 |
| Grant date | Jul 15, 2008 |
| Priority date | — |
| Expiry date | Nov 7, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for analyzing one or more ion species of a sample including a first ion mobility filter associated with a first flow path for passing first ions of the sample, a second ion mobility filter associated with a second flow path for passing second ions of the sample, a first outlet from the first flow path for passing a portion of the first ions from the first flow path to the second flow path, and a first outlet from the second flow path for removing neutral particles from the second flow path where the first outlet from the second flow path is upstream of the second ion mobility filter in relation to the ion flow in the second flow path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.