Computing values for surveying a subterranean structure based on measurements according to different electromagnetic survey techniques
US7400977B2 · kind B2 · utility
15Cited by
3References
19Claims
0Family size
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Key dates
| Filing date | Oct 12, 2006 |
| Grant date | Jul 15, 2008 |
| Priority date | — |
| Expiry date | Oct 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To survey a subterranean structure, first measurement data according to a first electromagnetic survey technique and second measurement data according to a second, different electromagnetic survey technique are received. An output value for surveying the subterranean structure is computed based on the first and second measurement data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.