Patent · US Expired

Measurement method and device for the measurement of a path covered

US7401506B2 · kind B2 · utility

5Cited by
12References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 28, 2004
Grant dateJul 22, 2008
Priority date
Expiry dateJul 23, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L1/046
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

With a measurement method and a measurement device for the measurement of a path covered by a first object (1) in relation to a second object (2), a measurement body (3) is deformed by a relative movement of the objects and at least a first deformation sensor (4) assigned to the measurement body (3) converts the measurement body (3) deformation into a measurement signal. The measurement signal is converted by an evaluation device (20) into information on the path covered. In order to increase the precision and measurement speed in a way that is simple structurally and saves space, the measurement signal is emitted when an area of the measurement body (3) is stretched along the longitudinal axis (6) of the measurement body (3) and a further area is compressed along the longitudinal axis (6) of the measurement body (3).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.