Detection of defects by thermographic analysis
US7401976B1 · kind B1 · utility
6Cited by
20References
6Claims
0Family size
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Key dates
| Filing date | Aug 25, 2000 |
| Grant date | Jul 22, 2008 |
| Priority date | — |
| Expiry date | Sep 8, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A mechanism is provided for detecting a defect in a populated sample having a thickness dimension substantially smaller than the length and width dimensions thereof, the populated sample having a first side and an opposite second side, at least said first side of said populated sample having one or more Surface Mounted Components. The mechanism exploits a standard thermographic image which may be used in a detection method comprising
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.