Apparatuses and methods for outputting signals during self-heat burn-in modes of operation

US7403027B2 · kind B2 · utility

Assignee

• Intel Corporation · US

Inventors

• Yuen Tat Lee · Bayan Lepas, MY
• Soon Eng Low · Bukit Mertajam, MY
• Naveendran Balasingam · Kuala Lumpur, MY

Key dates

• Filing date: Oct 30, 2006
• Grant date: Jul 22, 2008
• Expiry date: Oct 30, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2856
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An apparatus and method for selecting and outputting test patterns and internal signals during various SHBI modes of operation. The apparatus may include multiple input/output (I/O) pins, one or more functional blocks, a Self-Heat Burn-In (SHBI) state machine that is coupled to the I/O pins and the one or more functional blocks, and a logic selector circuitry that is coupled to the SHBI state machine and the one or more functional blocks. The SHBI state machine may provide to the I/O pins with first one or more test patterns during a first SHBI mode of operation, and to provide the one or more functional blocks with second one or more test patterns during a second SHBI mode of operation. The logic selector circuitry is configured to select and output the first one or more test patterns to stress the I/O pins during the first SHBI mode of operation, and to select and output internal signals of the one more functional blocks during the second SHBI mode of operation.