Method for reducing leakage current in a vacuum field emission display
US7404750B2 · kind B2 · utility
2Cited by
2References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2005 |
| Grant date | Jul 29, 2008 |
| Priority date | — |
| Expiry date | Apr 18, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J31/127
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A fabrication process is provided for reducing leakage current in a field emission display having at least one electron emitter (24) electrically coupled to a ballast resistor (16) coupled to a cathode metal (14), wherein at least one defect (28) extends to a gate electrode (20) from a region (22) electrically coupled to the ballast resistor, the method comprising heating (32) to reduce the resistance of the ballast resistor; and applying (34) a voltage between the cathode metal and the gate electrode thereby creating a current through the at least one defect to create an electrical open therein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.