Signal analysis system and calibration method for measuring the impedance of a device under test
US7405575B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2006 |
| Grant date | Jul 29, 2008 |
| Priority date | — |
| Expiry date | Aug 23, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.