System, method, and computer product for detection instrument calibration
US7406391B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 20, 2005 |
| Grant date | Jul 29, 2008 |
| Priority date | — |
| Expiry date | Apr 29, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6452
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment, a method of determining a drift value is described that includes performing one or more X-axis translations of an excitation beam over a probe array; measuring light responsive to the excitation beam from at least two positional reference elements associated with the probe array for the X-axis translations; calculating a distance value for the X-axis translation using a positional relationship of a known location associated with each of the positional reference elements and positions of the positional reference elements from the measured light; and determining a drift value using a difference between the calculated distance value and an expected distance value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.