Patent · US Expired

Scan chain partition for reducing power in shift mode

US7406639B2 · kind B2 · utility

3Cited by
3References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 13, 2004
Grant dateJul 29, 2008
Priority date
Expiry dateAug 17, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318575
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A scan chain partition includes a serial input coupled to a scan input signal pin of a module under test. A plurality of scan sub-chains is coupled to the serial input. A scan sub-chain output multiplexer is coupled to the plurality of scan sub-chains for sequentially selecting only one of the scan sub-chains in response to a scan sub-chain control signal. A scan sub-chain controller generates the scan sub-chain control signal and gates a scan clock signal to only a scan clock input of the selected scan sub-chain.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.