Patent · US Expired

Method for performing design rule check of integrated circuit

US7406671B2 · kind B2 · utility

5Cited by
16References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 5, 2005
Grant dateJul 29, 2008
Priority date
Expiry dateApr 7, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/398
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a method for performing design rule check (DRC) of an integrated circuit. A design layout of the integrated circuit is provided. The integrated circuit includes a complex circuit. A DRC tool is used to compare a portion of the design layout with a reference layout containing an accurate implementation of the complex circuit. The portion of the design layout corresponds to the complex circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.