Adaptable end effector for atomic force microscopy based nano robotic manipulators
US7406859B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2006 |
| Grant date | Aug 5, 2008 |
| Priority date | — |
| Expiry date | Dec 8, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q80/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved nanomanipulation system is provided for performing nanomanipulation operations in relation to a sample surface. The system includes: an atomic force microscope having a probe for performing nanomanipulation operations on the sample surface, where the probe includes a cantilever having a layer of piezoelectric material; a position detector configured to ascertain deformation of the cantilever during a nanomanipulation operation; and an adaptable end effector controller adapted to receive data indicative of the deformation from the position detector and implements a control scheme based on the deformation data. The control scheme produces a control signal that is applied to the piezoelectric material of the cantilever, thereby maintaining the straight shape of the cantilever during the nanomanipulation operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.