Patent · US Expired

Method and apparatus for measuring thermophysical properties

US7407325B2 · kind B2 · utility

4Cited by
2References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2005
Grant dateAug 5, 2008
Priority date
Expiry dateNov 20, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention provides a method for measuring thermophysical properties that includes: rapid resistive self-heating of a specimen by using a heating current; emitting a light to the specimen heated by the rapid resistive self-heating of the specimen; measuring a temperature change of the specimen induced by emitting the light to the specimen; and deriving a thermal diffusivity of the specimen from the temperature change induced by emitting the light to the specimen.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.