Patent · US Expired

Method and system for high-speed, precise micromachining an array of devices

US7407861B2 · kind B2 · utility

3Cited by
41References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 18, 2005
Grant dateAug 5, 2008
Priority date
Expiry dateMar 11, 2026

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K2103/50
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. The number of resistance measurements are limited by using non-measurement cuts, using non-sequential collinear cutting, using spot fan-out parallel cutting, and using a retrograde scanning technique for faster collinear cuts. Non-sequential cutting is also used to manage thermal effects and calibrated cuts are used for improved accuracy. Test voltage is controlled to avoid resistor damage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.