Patent · US Expired

Epitaxial growth of aligned AlGalnN nanowires by metal-organic chemical vapor deposition

US7407872B2 · kind B2 · utility

14Cited by
3References
25Claims
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Key dates

Filing dateAug 19, 2005
Grant dateAug 5, 2008
Priority date
Expiry dateNov 18, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/763
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Highly ordered and aligned epitaxy of III-Nitride nanowires is demonstrated in this work. <1010> M-axis is identified as a preferential nanowire growth direction through a detailed study of GaN/AlN trunk/branch nanostructures by transmission electron microscopy. Crystallographic selectivity can be used to achieve spatial and orientational control of nanowire growth. Vertically aligned (Al)GaN nanowires are prepared on M-plane AlN substrates. Horizontally ordered nanowires, extending from the M-plane sidewalls of GaN hexagonal mesas or islands demonstrate new opportunities for self-aligned nanowire devices, interconnects, and networks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.