Patent · US Expired

Inside testing for paths

US7408553B1 · kind B1 · utility

37Cited by
28References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 15, 2005
Grant dateAug 5, 2008
Priority date
Expiry dateJan 28, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T11/40
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Systems and methods for identifying pixels that are inside a two-dimensional path may be used to fill the path. The path is segmented and a point in space is identified that is used to generate a triangle fan, where each triangle in the fan is formed by one of the segments of the path and the point. Locations in a winding buffer are updated for each pixel that is within a triangle of the triangle fan. The resulting winding buffer indicates the pixels that are inside the two-dimensional path. The winding buffer may be used to fill the path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.