Inside testing for paths
US7408553B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2005 |
| Grant date | Aug 5, 2008 |
| Priority date | — |
| Expiry date | Jan 28, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for identifying pixels that are inside a two-dimensional path may be used to fill the path. The path is segmented and a point in space is identified that is used to generate a triangle fan, where each triangle in the fan is formed by one of the segments of the path and the point. Locations in a winding buffer are updated for each pixel that is within a triangle of the triangle fan. The resulting winding buffer indicates the pixels that are inside the two-dimensional path. The winding buffer may be used to fill the path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.