Phase-contrast x-ray imaging systems and methods
US7412026B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2005 |
| Grant date | Aug 12, 2008 |
| Priority date | — |
| Expiry date | Aug 31, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2207/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates systems and methods for phase-contrast x-ray imaging of an object. In one embodiment, the system includes an x-ray source, a detector, and an object-map generator. The x-ray source transmits x-rays, and the detector is positioned so as to receive at least a portion of the x-rays transmitted by the x-ray source and output an image signal indicative of an intensity measurement of the x-rays received. The object is positioned between the x-ray source and the detector. The detector is then used to acquire intensity measurements at two different positions and output the same to the object-map generator. The object-map generator then utilizes the image signals of the detector, along with algorithms, including phase-retrieval algorithms to generate an attenuation-map and a phase-map for the object. The present invention also include systems and methods utilizing a dual-detector arrangement, a multi-source arrangement, and a mosaic source-detector arrangement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.