Method of analysis of local patterns of curvature distributions
US7412084B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 10, 2004 |
| Grant date | Aug 12, 2008 |
| Priority date | — |
| Expiry date | Jan 30, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of detecting lesions and polyps in a digital image, wherein said image comprises a plurality of 3D volume points, is provided. The method includes identifying a surface in the image, and for each point in the image, calculating a first curvature measure, forming a set of rings of points about each point, each ring being of equal geodesic distance from a center point for the ring, calculating, for each ring, a standard deviation of the first curvature measure, and selecting those rings with a minimum standard deviation for the first curvature measure. A first curvature slope is calculated for the selected rings, those points where the curvature slope departs from the pattern expected for a polyp or lesion are deleted from the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.