Systems and methods for analyzing an abnormality of an object
US7412280B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2003 |
| Grant date | Aug 12, 2008 |
| Priority date | — |
| Expiry date | Jan 20, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/30
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In one embodiment, a method for analyzing at least one abnormality of an object is described. The method includes obtaining a first image containing an abnormality using a first modality, obtaining a second image containing the abnormality using a second modality, selecting a first region of interest located within the first image, determining an anatomical size of the abnormality based on the first region of interest in the first image, and determining a relative metabolic activity based on a second region of interest within the second image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.