Patent · US Expired

Systems and methods for analyzing an abnormality of an object

US7412280B2 · kind B2 · utility

15Cited by
7References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 1, 2003
Grant dateAug 12, 2008
Priority date
Expiry dateJan 20, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/30
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

In one embodiment, a method for analyzing at least one abnormality of an object is described. The method includes obtaining a first image containing an abnormality using a first modality, obtaining a second image containing the abnormality using a second modality, selecting a first region of interest located within the first image, determining an anatomical size of the abnormality based on the first region of interest in the first image, and determining a relative metabolic activity based on a second region of interest within the second image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.