Methods for delay-fault testing in field-programmable gate arrays
US7412343B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2003 |
| Grant date | Aug 12, 2008 |
| Priority date | — |
| Expiry date | Jul 1, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for delay-fault testing field programmable gate arrays (FPGA's), applicable both for off-line manufacturing and system-level testing, as well as for on-line testing within the framework of the roving self-test area (STARs) approach are described. In one described method, two or more paths under test receive a test pattern approximately simultaneously. The two paths are substantially identical and thus should propagate the signal in approximately the same amount of time. An output response analyzer receives the signal from each of the paths and determines the interval between them, and then determines whether a delay fault has occurred based at least in part on the interval. The output response analyzer may include an oscillator and a counter. The oscillator generates an oscillating signal during the interval between when the test signal propagates through the first path and the last path under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.