Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts
US7414417B2 · kind B2 · utility
1Cited by
14References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 8, 2004 |
| Grant date | Aug 19, 2008 |
| Priority date | — |
| Expiry date | Aug 1, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0735
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one aspect of the invention, a contact sheet for testing electronic parts, comprising an insulating porous layer; and a connection electrode which is disposed on the insulating porous layer and electrically connect the electrode or terminal of the electronic parts and the terminal of a test apparatus; wherein the connection electrode is embedded below at least one main surface of the insulating porous layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.