Method and device for determining the 3D profile of an object

US7414732B2 · kind B2 · utility

Assignee

• STEINBICHLER OPTOTECHNIK GMBH · DE

Inventors

• Armin Maidhof · Raubling, DE
• Peter Andrā · Neubeuern, DE
• Manfred Adlhart · Bregenz, AT
• Michael Kaus · Hamburg, DE
• Markus Basel · Raubling, DE
• Frank Thoss · Neubeuern, DE
• Markus Lazar · Nußdorf, DE
• Thomas Nasswetter · Raubling, DE
• Hans Steinbichler · Neubeuern, DE

Key dates

• Filing date: May 16, 2001
• Grant date: Aug 19, 2008
• Expiry date: Jul 9, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B11/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is measured. The measured sections of the object (5) are combined (1).