Patent · US Active

Scanner linearity tester

US7414759B2 · kind B2 · utility

2Cited by
8References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 26, 2003
Grant dateAug 19, 2008
Priority date
Expiry dateAug 4, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N2201/04744
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Linear spot velocity or position variations are measured in a scanning system by a process and apparatus. The process comprises providing at least two radiation detectors that can move in tandem across a scan line, the two radiation detectors being spaced apart by a distance d; positioning the at least two radiation detectors at a first point on the scan line; scanning the at least two radiation detectors with scanning radiation and recording the position of the two detectors along the scan line and the time taken for the scanning radiation to scan from a first of the at least two radiation detectors to a second of the at least two radiation detectors while the at least two radiation detectors are positioned at the first point; moving the at least two radiation detectors to a second point on the scan line maintaining the distance d between the at least two radiation detectors; and again scanning the at least two radiation detectors with scanning radiation and recording the position of the two detectors along the scan line and the time taken for the scanning radiation to scan from a first of the at least two radiation detectors to a second of the at least two radiation detectors whi…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.