Patent · US Expired

Neo-wafer device and method

US7417323B2 · kind B2 · utility

0Cited by
5References
5Claims
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Assignee

Inventor

Key dates

Filing dateNov 6, 2003
Grant dateAug 26, 2008
Priority date
Expiry dateNov 6, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A neo-wafer made from integrated circuit die and methods for making a neo-wafer are disclosed. A substrate is provided and includes a dielectric layer with conductive pads for the receiving of one or more integrated circuit die. Die are flip-chip bonded to the conductive pads and all voids under-filled. The neo-wafer is thinned to expose the conductive pads, creating a neo-wafer from which stackable neo-layers with known good die can be singulated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.