DTX detection method with high success probability
US7418063B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2001 |
| Grant date | Aug 26, 2008 |
| Priority date | — |
| Expiry date | Jun 10, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B7/2656
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A wireless communications system receiver classifies a received burst as a DTX-high state normal burst or a DTX-low state truncated burst with a high probability of success. D1, the Euclidean distance between the known CDVCC and the bit position of CDVCC in a normal burst, is determined by calculating a confidence-weighted correlation between the two bit patterns. In a high-noise environment, D2, the Euclidean distance between the known CDVCC and the bit position of CDVCC in a truncated burst, is calculated. The ratio D1/D2 is compared to a threshold to classify the DTX state of the received burst. D1 and D2 may be normalized by dividing by the maximum average RSSI over the received burst, plotted on a graph of normalized D1 vs. normalized D2, and compared to a predetermined thresholding function that minimizes the probability of false classification. The thresholding function may be a piece-wise linear curve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.