Method for estimating examinee attribute parameters in a cognitive diagnosis model
US7418458B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2005 |
| Grant date | Aug 26, 2008 |
| Priority date | — |
| Expiry date | Mar 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09B7/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.