Multiple axis multipoint non-contact measurement system
US7420196B2 · kind B2 · utility
1Cited by
11References
4Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 27, 2006 |
| Grant date | Sep 2, 2008 |
| Priority date | — |
| Expiry date | Feb 27, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for optically measuring a remote object comprises at least one source for projecting a plurality of discrete zones of electromagnetic radiation (for example laser spots) along a projection plane. Imaging apparatus images a plurality of reflections from the remote object. By spatially offsetting the imaging apparatus from the projection plane, easier discrimination and identification of the reflections is made possible.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.