Method and arrangement for analyzing samples
US7420674B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 14, 2003 |
| Grant date | Sep 2, 2008 |
| Priority date | — |
| Expiry date | Feb 23, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and/or arrangement for the analysis of fluorescing samples in an image-generating microscope system, preferably a laser scanning microscope, wherein the sample is scanned point-by-point or line-by-line in at least one surface section and a dispersive splitting of the radiation coming from the sample is carried out during the scanning, wherein the split radiation is detected by at least one line of detector elements in a wavelength-dependent manner, a selection of two-dimensional or three-dimensional sample parts which correspond to pre-stored two-dimensional or three-dimensional geometric objects or the like is carried out based on the recorded and stored intensity distribution of at least one of these detection elements and/or at least one other detection element for the radiation reflected from the sample by image processing, and an analysis of the spectral signature and/or spatial spectral sequence is carried out for at least a portion of these sample regions with respect to the fluorescence markers arranged thereon.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.