Wavelength measurement method based on combination of two signals in quadrature
US7420686B2 · kind B2 · utility
12Cited by
12References
15Claims
0Family size
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Key dates
| Filing date | Jan 8, 2007 |
| Grant date | Sep 2, 2008 |
| Priority date | — |
| Expiry date | Mar 17, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/0246
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a measurement is in the second dead zone, only the first etalon signal is employed to determine wavelength. When a measurement is in neither zone, both first and second etalon signals are employed to determine the wavelength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.