Apparatus and method for analyzing model quality in a process control environment
US7421374B2 · kind B2 · utility
52Cited by
15References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2005 |
| Grant date | Sep 2, 2008 |
| Priority date | — |
| Expiry date | Apr 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B17/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method includes identifying a signal and a disturbance associated with a model. The signal and disturbance are identified using historical data associated with one or more process variables. The method also includes decomposing the signal and the disturbance at a plurality of resolution levels. The method further includes extracting a plurality of data segments from the signal using the decomposed signal and the decomposed disturbance. In addition, the method includes determining a quality of the model using the extracted data segments and at least a portion of the historical data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.