Patent · US Expired

Duct probe assembly system for multipoint air sampling

US7421911B2 · kind B2 · utility

42Cited by

12References

48Claims

0Family size

Inventors

Eric Desrochers · Merrimack, US
Gordon P. Sharp · Newton, US

Key dates

Filing date	Dec 20, 2005
Grant date	Sep 9, 2008
Priority date	—
Expiry date	Dec 20, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01N1/26
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

This invention details apparatus and methods for a unique integrated duct probe assembly system that enables multipoint sampling systems to cost effectively measure air parameters in partially confined locations such as ductwork, plenums, and air handlers with both remote and local sensors with a minimum of duct penetrations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.