Patent · US Expired

Semiconductor devices

US7423316B2 · kind B2 · utility

26Cited by
6References
8Claims
0Family size

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Key dates

Filing dateMay 12, 2005
Grant dateSep 9, 2008
Priority date
Expiry dateJun 15, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/117

Abstract

The dense accumulation of hole carriers can be obtained over a wide range of a semiconductor region in a floating state formed within a body region of an IGBT. An n type semiconductor region (52) whose potential is floating is formed within a p− type body region (28). The n type semiconductor region (52) is isolated from an n+ type emitter region (32) and an n− type drift region (26) by the body region (28). Furthermore, a second electrode (62) is formed, so as to oppose to at least a part of the semiconductor region (52) via an insulator film (64). The second electrode (62) does not oppose to the emitter region (32).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.