Patent · US Expired

Method and apparatus for the non-destructive and contactless detection of faults in a test piece which is moved relative to a probe

US7423424B2 · kind B2 · utility

5Cited by
7References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 18, 2005
Grant dateSep 9, 2008
Priority date
Expiry dateMay 14, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N29/449
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method for nondestructive and contact-free detection of faults in a test specimen which is moved relative to a probe that detects a periodic electrical signal having a carrier oscillation whose amplitude and/or phase is/are modulated by any fault in the test specimen. The probe signal is filtered and sampled by a triggerable A/D converter stage to obtain a demodulated digital measurement signal which is filtered using a digital frequency-selective adjustable second filter unit to obtain a useful signal which is evaluated to detect a fault in the test specimen. The A/D converter stage is triggered at a fraction of the frequency of the carrier oscillation selected as a function of the fault frequency obtained as the quotient of the relative speed between the test specimen and the probe and the effective width of the probe, and the frequency-selective second filter unit is adjusted as a function of the fault frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.