Patent · US Active

Providing optimal supply voltage to integrated circuits

US7423475B2 · kind B2 · utility

5Cited by
3References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 9, 2004
Grant dateSep 9, 2008
Priority date
Expiry dateAug 3, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C5/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A characteristic is measured on multiple portions of an integrated circuit, and the supply voltage adjusted based on the measurements. In an embodiment, the characteristic corresponds to propagation delay which indicates whether the integrated circuit is implemented with a strong, weak or nominal process corner. In general, the supply voltage can be increased in the case of a weak process corner and decreased in the case of a strong process corner.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.