Patent · US Expired

Method and apparatus for monitoring an interferometer

US7423760B2 · kind B2 · utility

1Cited by

3References

19Claims

0Family size

Assignee

AGILENT TECHNOLOGIES, INC. · US

Inventors

Wolf Steffens · Herrenberg, DE
Ulrich Kallmann · Lörrach, DE
Bernd Nebendahl · Leonberg, DE
Emmerich Mueller · Aidlingen, DE
Ralf Haeussler · Schrobenhausen, DE

Key dates

Filing date	Oct 11, 2002
Grant date	Sep 9, 2008
Priority date	—
Expiry date	Sep 27, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01J2009/0261
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus and to a method of monitoring an interferometer, comprising the steps of: coupling a first optical signal into the interferometer and into a wavelength reference element, detecting a first resulting interference signal being a result of interference of parts of the first optical signal in the interferometer, detecting a resulting reference signal of the wavelength reference element, the resulting reference signal being a result of interaction of the first optical signal with the wavelength reference element, and comparing the first resulting interference signal with the resulting reference signal to detect a drift of the interferometer, if any.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.