Patent · US Expired

Method for simulation with optimized kernels and debugging with unoptimized kernels

US7424418B1 · kind B1 · utility

4Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 31, 2003
Grant dateSep 9, 2008
Priority date
Expiry dateJun 2, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for providing verification for a first simulation image involves removing nodes from the first simulation image to produce an optimized image and an optimized nodes image, simulating the optimized image, invoking the optimized nodes image if debugging is selected, reconstructing a second simulation image using the optimized image and the optimized nodes image, simulating the second simulation image to gather simulation data, and debugging the first simulation image using simulation data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.