Method and apparatus for selectively providing data from a test head to a processor
US7425719B2 · kind B2 · utility
74Cited by
36References
44Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 23, 2005 |
| Grant date | Sep 16, 2008 |
| Priority date | — |
| Expiry date | Nov 15, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical test head comprises one or more detectors for providing output signals indicative of the condition of a workpiece surface. Data from these detectors are stored in one or more memories only when the data from the detectors satisfy one or more conditions (e.g. the data exceed than a particular threshold). The data are then passed from the one or more memories to an electrical circuit for processing. In addition, location information is stored in one or more memories and passed on to the electrical circuit when the data from the detectors satisfy the one or more conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.